Kok Hui Yeo
Reliability Engineer@ Texas Instruments
Lehi, Utah, United States
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Kok Hui Yeo is a highly experienced professional with 16.3 years of work experience in semiconductors and product engineering. He has a strong background in failure analysis, testing, and device characterization. Kok Hui Yeo has expertise in FMEA, yield enhancement, and silicon debug. He is skilled in root cause analysis, root cause analysis, and root cause analysis. Currently, he is managing CMOS and Array reliability projects for 3DxP. Kok Hui Yeo has worked for reputable companies such as Texas Instruments, Micron Technology, and IM Flash. He is based in Lehi, Utah.
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Emails and Phone Numbers

@imflash.com
@ti.com
@gmail.com
@imftech.com
@ti.com
+1 407206****
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About

Managing CMOS and Array reliability projects for 3DxP

Work Experience

12500 TI Boulevard, Dallas, TX, 75243, US

Semiconductor Manufacturing

30287
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Kok Hui Yeo's Professional Milestones

  • 3dxp Hvm Reliability Engineer (2019-11-01~2021-10-01): Implementing robust HNVM systems and ensuring robust functionality for maximum reliability in HVM infrastructure.
  • Senior Quality Management System Engineer (2012-03-01~2015-01-01): Streamlined quality management processes, ensuring accurate and seamless execution of adherence to certification standards.
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Education

Nanyang Technological University Singapore
Nanyang Technological University Singapore

Electrical & Electronic Engineering

2003-2007